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TAP3500泰克示波器有源探頭
簡要描述:

TAP3500泰克示波器有源探頭:
40 k? Input Resistance
–4 V to +4 V Input Dynamic Range
–10 V to +10 VDC Input Offset Range
±30 V (DC + peak AC) Max Input Voltage (Nondestruct)

  • 產(chǎn)品型號(hào):
  • 廠商性質(zhì):代理商
  • 更新時(shí)間:2025-11-01
  • 訪  問  量:1356

TAP3500泰克示波器有源探頭的性能特點(diǎn):www.chem17.com/st240071

Features & Benefits

  • Outstanding Electrical Performance
    • High Probe Bandwidth
    • Fast Probe Rise Time
    • Excellent Signal Fidelity
    • ≤0.8 pF Input Capacitance
    • 40 k? Input Resistance
    • –4 V to +4 V Input Dynamic Range
    • –10 V to +10 VDC Input Offset Range
    • ±30 V (DC + peak AC) Max Input Voltage (Nondestruct)
  • Versatile Mechanical Performance
    • Small Compact Probe Head for Probing Small Geometry Circuit Elements
    • DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
    • Robust Design for Reliability
  • Easy-to-Use
    • Connects Directly to Oscilloscopes with the TekVPI™ Probe Interface
    • Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
    • Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
    • Remote GPIB/USB Probe Control through the Oscilloscope

Applications

  • Verification, Debug, and Characterization of High-speed Designs
  • Signal Integrity, Jitter, and Timing Analysis
  • Manufacturing Engineering and Test
  • Signals with Voltage Swings up to 8 Vpk-pk

 

Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high-frequency measurements. With our ultra-low input capacitance and unique interface, the TAP2500 and TAP3500 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP2500 and TAP3500 Active FET probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional problems:

  • Lower DUT loading effects with ≤0.8 pF input capacitance and 40 k? input resistance
  • Versatile DUT connectivity for attaching to small SMDs
  • Preserves instrument bandwidth at the probe tip for up to 3.5 GHz oscilloscopes

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