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美國泰克P6246示波器探頭
簡要描述:

美國泰克P6246示波器探頭
1.7 GHz (Typical Probe Only ≤27 °C) 1X Mode
1.5 GHz Bandwidth (Guaranteed)
1.85 GHz (Typical Probe Only ≤27 °C) 10X Mode

  • 產(chǎn)品型號:
  • 廠商性質(zhì):代理商
  • 更新時間:2025-10-31
  • 訪  問  量:1070

美國泰克P6246示波器探頭的詳細(xì)介紹:

Features & Benefits

P6248

  • 1.7 GHz (Typical Probe Only ≤27 °C) 1X Mode

  • 1.5 GHz Bandwidth (Guaranteed)

  • 1.85 GHz (Typical Probe Only ≤27 °C) 10X Mode

P6247

  • >1.0 GHz Bandwidth (Guaranteed)

P6246

  • 400 MHz Bandwidth (Guaranteed)

General

  • Low Input Capacitance:<1 pF Differential

  • Probe Input Connector: Two Standard 0.025 in./0.63 mm (0.1 in. Center) Square Pin Receptacle (Female)

  • Electrostatic Discharge Tolerant (IEC 801-2)

  • Connects to TekProbe® BNC Interface on TDS Series Oscilloscopes or Other Instruments using 1103 TekProbe® Power Supply

  • For use with Oscilloscopes, Spectrum Analyzers, or Network Analyzers

  • >60 dB (1000:1) Common Mode Rejection Ratio (CMRR)

  • Small Probe Head Allows Easy Probing of SMDs

Applications

  • Communications (Gigabit Ethernet, IEEE-1394, Fibre Channel)

  • Semiconductor Characterization (RAMBUS)

  • Disk Drive Read Channel Design

  • Communication Pulse Shape Compliance

  • Jitter, Crosstalk, and BERT Measurements

  • Location of Ground Bounce

The P6246, P6247, and P6248 Differential Probes

The P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS), and communication applications (Gigabit Ethernet, IEEE-1394 Firewire, and Fibre Channel). The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices while maintaining high CMRR.

The P6246, P6247, and P6248 are ideal for design verification of disk drive read, channel electronics, and timing analysis for troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse shape or crosstalk compliance testing of high-speed communication signals.


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